NeoScope JCM-5000 bench top Scanning Electron Microscope (SEM) •Easy to use: digital camera-looking interface •Anyone can learn to use it in 30 min, even a beginner. •Compact •Image in three minutes after loading specimen •Coating not always necessary due to low vacuum observation mode. •Dimensions of main unit: 492 mm (width) x 458 mm (depth) x 434 mm (height), 63 kg | |||
Keywords: | SEM | ||
Measurements: | Micrography, analysis of cracks and fracture surfaces, bond failures and physical defects. | ||
Specifications: | •A real magnification range of 10X - 20000X •High vacuum and low vacuum modes •3 different kV presets (5, 10, 15 kV) •Sample stage allows 35 mm travel in X and Y •Maximum sample size 70 mm diameter and 50 mm thickness •Secondary and back-scatter imaging modes | ||
Equipment: | •3 piezoelectric force cells, from 4 kN to 60 kN •Measurement of the mass displacement during impact •Several plate and beam clamping devices •Data acquisition via oscilloscope and Labview | ||
Publications: | |||
Location: | Westhorst WH121 | ||
Research group: | |||
Contact: | Laura Vargas |