NanoSurf easyScan 2 •The Nanosurf easyScan 2 is an atomic force microscope that can measure the topography and several other properties with nanometer resolution •Dual lens observation optics and automatic approach •Cantilever Alignment Chip technology allows simple and quick tip exchange without laser adjustments | ||
Keywords: | AFM, atomic force microscopy, surface topography, surface roughness | |
Measurements: | Micrography, topography, analysis of thin films or coatings, defects, roughness | |
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Location: | Westhorst WH121 | |
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Contact: | Laura Vargas |