Thermo Scientific Helios 5 UX DualBeam
The Thermo Scientific Helios 5 UX DualBeam is the FIB/SEM of the MESA+ Nanolab.
The Helios is specialised at making high-quality, thin lamella for TEM. The Pheonix ion column gives the ability to polish at voltages down to 500 V, drastically reducing damage from the milling. With the MultiChem gas inlet system, a choice of C, Pt of W can be used for protection and welding, giving options no matter what the nature of the sample. The EasyLift micromanipulator allows for precise and accurate handling of samples.
Apart from TEM preparation, the Helios is an impressive microscope in it’s own right. With an Elstar UC+ column giving <2 nm resolution at 15 kV. The Helios hosts a variety of secondary electron detectors, dedicated backscatter detectors, a multi-sectional STEM and an EDX for elemental analysis. The ability to thin samples in-situ is particularly useful for STEM and EDX, increasing the resolution of the sample quickly and easily.
The Auto Slice and View software allows for 3D tomography of structure. The machine makes slices of known thickness and creates a high resolution image after each slice. These slices can be used to make a full 3D reconstruction of the sample, with a 10 nm voxel resolution. Whilst destructive, this is a relatively easy and high resolution method of tomography. There is also the option of creating an EDX map at each slice, giving a 3D elemental analysis.
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